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tools for attosecond metrology and imaging
CE-Phasemeters: They measure the carrier-envelope (CE) phase of few-cycle NIR pulses by using a dual (stereo) time-of-flight electron spectrometer, both single-shot and multi-shot options available.
Optical-field-driven streak cameras: Standard instrumentation included in all attosecond beamlines for the measurement of sub-fs or asec VUV/XUV/X-ray pulses and the electric field of few-cycle laser pulses by photoelectron streaking. They incorporate a time-of-flight electron spectrometer.
Attograminternal link: Software for analyzing attosecond streaking measurements for determining the electric field of few-cycle laser pulses and the intensity profile and chirp of attosecond pulses. It extends the concept of FROG to the attosecond regime, for details, see Appl. Phys. B 92, 25-32 (2008).
Time-of-flight electron spectrometers: By measuring the flight time of electrons in a field free drift tube, their kinetic energy can be determined. The electron kinetic energy spectrum after the ionization of atoms by powerful fs / as laser pulses allows the investigation of inner atomic charge dynamics and the evolution of ionization. Our instrument is optimized for an extended acceptance angle and energy resolution better then 100 meV.
Reflectrons: Reflectron-type time-of-flight ion spectrometers are specialized instruments allowing to detect ions exclusively from a well defined µm-sized test volume with high mass resolution. The Reflectron is used to measure the increase / decrease of a specific charge state as a function of local beam intensity, overcoming the limitations due to the volume effect in conventional detection schemes.
Ion microscope: The Ion microscope generates a hundredfold magnified image of ion distributions based on advanced electrostatic optical elements and a time-gated MCP / Phosphor / CCD arrangement. It allows the investigation of focal structures with potentially sub-wavelength resolution, allowing the interference pattern generated by counter propagating fs / as pulses to be resolved.
COLTRIMS and VMI: Systems for measuring the momentum distribution of ions and/or electrons originating from strong-field interactions. COLTRIMS (cold target recoil ion momentum spectroscopy) allows for the coincident detection of ions and electrons from one atom/molecule per laser shot. Velocity-map imaging (VMI) detectors are used to measure either ion or electron momentum distribution.
Attosecond PEEM: Photoelectron emission microscope for the observation of electrons emitted from a nano-structured surface in UHV environment. It combines photoelectron energy spectroscopy (with resolutions of ∼60meV) with the nano-metre (∼10-20 nm) resolution of electron microscopes. Attosecond temporal resolution comes from exciting the photoelectrons with an attosecond XUV probe following the excitation under study. It will provide direct and non-invasive access to spatiotemporal dynamics of nanoplasmonic fields.
XUV transmission spectrometer: Apparatus for measuring the spectral distribution of attosecond XUV continua transmitted through gaseous or thin solid samples. It allows attosecond transient absorption spectroscopy.

contact: E. Goulielmakislink to the personal page of Eleftherios Goulielmakis, X. Gulink to the personal page of Xun Gu, L.Veiszlink to the personal page of Laszlo Veisz
Fig. 1. Concept of optical-field-driven attosecond streaking. Photoelectrons released in a laser field parallel to the direction of electric field (red line) suffer a change of their initial velocities that is proportional to the vector potential of the field (black line) at the instant of release. This function is monotonic within a half wave cycle of the field, mapping the intensity profile of a sub-fs XUV pulse into a corresponding final velocity (or energy) distribution of photoelectrons.
Fig. 1. Concept of optical-field-driven attosecond streaking. Photoelectrons released in a laser field parallel to the direction of electric field (red line) suffer a change of their initial velocities that is proportional to the vector potential of the field (black line) at the instant of release. This function is monotonic within a half wave cycle of the field, mapping the intensity profile of a sub-fs XUV pulse into a corresponding final velocity (or energy) distribution of photoelectrons.
Fig. 2. The streaking spectrogram (upper trace) recorded with the optical-field-driven streak camera incorporated in the AS-1 attosecond beamline at LAP allows complete retrieval of the few-cycle near-infrared streaking electric field (red line) and the temporal intensity profile (green line) and temporal phase (blue line) of the attosecond pulse with the help of the ATTOGRAM algorithm described in Appl. Phys. B 92, 25 (2008).
Fig. 2. The streaking spectrogram (upper trace) recorded with the optical-field-driven streak camera incorporated in the AS-1 attosecond beamline at LAP allows complete retrieval of the few-cycle near-infrared streaking electric field (red line) and the temporal intensity profile (green line) and temporal phase (blue line) of the attosecond pulse with the help of the ATTOGRAM algorithm described in Appl. Phys. B 92, 25 (2008).
Fig. 3. The Attogram software for complete reconstruction of electron wave packets from attosecond streaking measurement. (© vlad)
Fig. 3. The Attogram software for complete reconstruction of electron wave packets from attosecond streaking measurement. (© vlad)
Fig. 4. The time-frequency analysis of high-harmonic radiation generated by a 3.3-fs infrared laser pulse. (© vlad)
Fig. 4. The time-frequency analysis of high-harmonic radiation generated by a 3.3-fs infrared laser pulse. (© vlad)
Fig. 5. COLTRIM setup for measuring the momentum distribution of ions and/or electrons originating from strong-field interactions. (© thn)
Fig. 5. COLTRIM setup for measuring the momentum distribution of ions and/or electrons originating from strong-field interactions. (© thn)